Advanced Defect and Contamination Inspection Solutions for Semiconductor and Microelectronics Industries
Precise Detection and Analysis with Onto Innovation’s Cutting-Edge Technology
Onto Innovation offers advanced defect and contamination inspection tools for full-surface defect detection, mapping, and classification on transparent, translucent, and opaque substrates. As a leading provider of process control solutions for the semiconductor and microelectronics industries, Onto Innovation is known for its cutting-edge inspection systems that enhance yield, reliability, and production efficiency. These tools enable precise detection and analysis of critical issues in semiconductor manufacturing.
As the distribution partner for Europe, S3 Alliance provides expert support, consultation, and seamless access to Onto Innovation’s inspection technology, helping you optimize your processes and maintain the highest quality standards.
Onto Innovation’s tools are designed for both surface and internal defect detection. Utilizing four detection channels operating simultaneously, their technology delivers unmatched performance, improving yield control and management across key industries, including semiconductor, consumer electronics, and the rapidly growing glass market for high-tech products.
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