by FASTMICRO
Equipment Others, Optical Surface Inspection
Fastmicro Sample Scanner
Surface cleanliness validation with 0.5 µm particle detection, objective reports and fast operator workflow.
INFODiscover Lumina Innovative Optical Inspection Systems for full-surface defect detection, mapping, and classification on transparent, translucent, and opaque substrates as well asPhaosTech Optical Microscopes.
Surface cleanliness validation with 0.5 µm particle detection, objective reports and fast operator workflow.
INFO