by KOVIS Technology
Wafer Dimensional Metrology
ATLANTIS C-SAM Inspection System
High speed Ultrasonic SAT scanning detects defects in semiconductor PKGs, HBM, TSV, and wafer bonding.
INFO
KOVIS Technology
by KOVIS Technology
Wafer Dimensional Metrology
Wafer Thickness & 3D Optical Profiler RT-3500
Hybrid metrology system measures wafer shape, sub-micro 3D structure, roughness.
INFO