400P-M Probe Card Cleaner

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By IMT

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Product Type:

Equipment


Application:

Dry Processing & UHP


Product Description:

The IMT 400P-M Probe Card Cleaner is a state-of-the-art dry cleaning system designed specifically for cleaning probe cards used in semiconductor testing. With its advanced laser cleaning technology, the 400P-M efficiently removes particles, residues, and contaminants from delicate probe card surfaces while preserving the integrity of the components. This ensures optimal testing performance and extended probe card lifespan.
The system is engineered for high precision cleaning, providing non-contact cleaning without causing any damage to the probe card’s delicate pins and contacts.
The 400P-M is ideal for semiconductor manufacturing environments where minimizing downtime and maintaining high throughput are critical.

 

Key Features:

  • Precision Cleaning: The 400P-M uses laser cleaning technology to remove particles and residues from probe card surfaces with high accuracy, ensuring no damage to sensitive probe tips and connections.
  • Dry Process: The system is completely dry, meaning no chemicals or water are required, eliminating the need for additional drying steps and reducing secondary waste.
  • Automated Process: Featuring an automated cleaning process, the 400P-M ensures high throughput, reduces manual intervention, and lowers operational costs.
  • Enhanced Productivity: With its fast, thorough cleaning process, the 400P-M significantly boosts production efficiency by minimizing probe card maintenance time.
  • User-Friendly Interface: The system comes with an intuitive control panel that allows easy operation and seamless integration into existing production workflows with minimal training required.

 

The IMT 400P-M Probe Card Cleaner is the ideal solution for manufacturers who require precise, efficient, and reliable cleaning to optimize probe card performance and extend the lifespan of their valuable testing equipment.


  • Cleaning Technology: Laser Cleaning (DLC & LSC)
  • Process: Non-contact cleaning
  • Cleaning Chambers: Single (Manual System)
  • Cleaning Time: Approx. 10-15 minutes per probe card
  • Interface: Touchscreen control system
  • Power Supply: 220V AC, 50/60Hz
  • Dimensions: Compact design for easy integration into production lines
  • Weight: Approx. 150kg

 

Advantages of the IMT 400P-M Probe Card Cleaner

Illustration of Laser Pulse to particles

Vaporising particles during Laser Pulse

Illustration after Laser Cleaning - no particles left

  • No Drying Process Required: The dry cleaning method eliminates the need for additional drying, enhancing operational efficiency.
  • Minimal Secondary Waste: The system generates minimal waste, further reducing operational costs and environmental impact.
  • No Surface Damage: The laser cleaning method ensures that the probe cards are cleaned without any damage to the delicate pins or contacts.
  • Easy Integration and Automation: The system is highly automated, with minimal manual intervention required, reducing labor costs and increasing productivity.

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Applications in Semiconductor/MEMS:

  • Probe Card Tip Cleaning
  • Particle Removal from Probe Card Surface
  • Contamination Removal After Testing
  • Bare Wafer Probe Card Cleaning
  • Cleaning of Probe Cards Used for Advanced Packaging



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Product Enquiry Form

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  • This field is for validation purposes and should be left unchanged.