For the Semiconductor / MEMS area

our advanced tools ensure accurate measurements, reliable inspections, and seamless automation, helping you optimize your production processes with ease. Explore our comprehensive offerings and elevate your manufacturing efficiency.

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Metrology

Optical Surface Inspection
Example image of the PrimaScan from Onto Innovation for the area: Optical Surface Inspection
Electron (SEM) & Optical Microscopy
Example image for Scanning Electron Microscope: CUBE 2, Tabletop SEM from EmCrafts as example image for Scanning Electron Microscope
Liquid Flow Measurement & Bubble Detection
Liquid Flow Measurement and Bubble Detection. Ultrasonic Clamp-On Flow Sensor SEMIFLOW co.65 260pi v2.0 from Sonotec
Chemical Concentration Meter
Example image for Chemical Concentration Meter. Rhosonics B30 Series with quaternary.
Wafer Dimensional Metrology
Example image for Wafer Dimensional Metrology. Nanomez WT3500 from Kovis, a hybrid metrology system.

Handling

Wafer Handling
Example image for Wafer Handling. STC Automatic Notch- /Flat-Aligner.
Automation
Example image for Automation. Wafermate300 from Jabil Chat Automation with dual loadport.
Others
Handling tools from CK Plas as example image for the area: Other Handling

new products here:

ATLANTIS™ C-SAM Inspection System
ATLANTIS™ C-SAM Inspection System
ATLANTIS™ C-SAM Inspection System
T Series Wafer Sorting / Handling / Inspection Platform
T Series Wafer Sorting / Handling / Inspection Platform
T Series Wafer Sorting / Handling / Inspection Platform
N Series Wafer Sorting / Handling / Inspection Platform
N Series Wafer Sorting / Handling / Inspection Platform
N Series Wafer Sorting / Handling / Inspection Platform
Vacuum Picker / Pen / Wand
Vacuum Picker / Pen / Wand
Vacuum Picker / Pen / Wand
PT Zoom Series – PTZ B+
PT Zoom Series – PTZ B+
PT Zoom Series – PTZ B+
Gemini
Gemini
Gemini
COMET 2 Station
COMET 2 Station
COMET 2 Station