Product Type:
Metrology & Handling
Application:
Wafer Handling
Product Description:
Tool for wafer inspection and ID reading
- Presents wafers for easy wand pick-up
- Units available with tilt base
- Indexing system for 5 selection combinations
- The five-point wafer alignment eliminates the possibility of wafers being scratched
- Resistant to acids, solvents, and particle adhesion
- Superior indexing system
- Models for each size wafer from 2″ to 8″
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Wafer inspection and wafer ID reading.