400P-M Probe Card Cleaner

Product Type:

Equipment

Application:

Trockenprozesse & UHP

Product Description:

The IMT 400P-M Probe Card Cleaner is a state-of-the-art dry cleaning system designed specifically for cleaning probe cards used in semiconductor testing. With its advanced laser cleaning technology, the 400P-M efficiently removes particles, residues, and contaminants from delicate probe card surfaces while preserving the integrity of the components. This ensures optimal testing performance and extended probe card lifespan.
The system is engineered for high precision cleaning, providing non-contact cleaning without causing any damage to the probe card’s delicate pins and contacts.
The 400P-M is ideal for semiconductor manufacturing environments where minimizing downtime and maintaining high throughput are critical.

Key Features:

• Precision Cleaning: The 400P-M uses laser cleaning technology to remove particles and residues from probe card surfaces with high accuracy, ensuring no damage to sensitive probe tips and connections.
• Dry Process: The system is completely dry, meaning no chemicals or water are required, eliminating the need for additional drying steps and reducing secondary waste.
• Automated Process: Featuring an automated cleaning process, the 400P-M ensures high throughput, reduces manual intervention, and lowers operational costs.
• Enhanced Productivity: With its fast, thorough cleaning process, the 400P-M significantly boosts production efficiency by minimizing probe card maintenance time.
• User-Friendly Interface: The system comes with an intuitive control panel that allows easy operation and seamless integration into existing production workflows with minimal training required.

The IMT 400P-M Probe Card Cleaner is the ideal solution for manufacturers who require precise, efficient, and reliable cleaning to optimize probe card performance and extend the lifespan of their valuable testing equipment.