by KOVIS Technology
Dimensionelle Wafer-Messtechnik
ATLANTIS™ C-SAM Inspection System
High speed Ultrasonic SAT scanning detects defects in semiconductor PKGs, HBM, TSV, and wafer bonding.
INFO
KOVIS Technology
by KOVIS Technology
Dimensionelle Wafer-Messtechnik
Wafer-Dickenmessung & Optischer 3D Profiler RT-350...
Hybrid-Messtechniksystem, misst Wafer-Form, submikroskopische 3D-Strukturen und Rauheit.
INFO