OptoNano 200

Product Type:

Metrology & Handling

Application:

Optische Mikroskopie

Product Description:

Advanced microscopy technology

Resolve down to 137 nm scale with OptoNano 200, the flagship of Phaos Technology.

The product combines the following key features:

• Accuracy
• Intuitive User Interface
• Super Resolution
• Extended Depth Of Field (EDoF)
• Extended Field of View (EFoV)
• Proprietary software Nova200

Accurate In-situ Measurement Tools

By enhancing super-resolution capability, nano pixels are distinctly segmented to achieve unprecedented precision, accuracy, and consistency in measurement results. A variety of measurement tools, ranging from 2D measurement to height measurement, is available and can be transferred into a detailed report for reference.

Intuitive User Interface

Using the ON200 software creates a seamless and adaptive Graphical User Interface (GUI) for efficient workflows. The importance of minimizing redundant work processes and enhancing efficiency to handle various tasks is well understood.

Super Resolution Visible Light Nano-Imaging

With the proprietary OptoNano Microsphere (OMN) technology, NANO imaging is easily captured through visible light and ambient air settings, surpassing the resolution of traditional compound and digital microscopes for superior image analysis.

Extended Depth of Field (EDoF)

Overcoming the limitations of Depth of Field (DoF) from microscope objective lenses, high-resolution, crystal-clear images are captured by stacking multiple layers together.

Extended Field of View (EFoV)

Stitching multiple fields of view together is essential for obtaining a comprehensive data overview in a single image while maintaining super resolution.