CUBE II (Tabletop SEM)

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By EMCrafts

Supplier Info

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Product Type:

Metrology & Handling

Application:

Scanning Electron Microscope

Product Description:

EMCrafts CUBE II Series:

Scanning Electron Microscope with World-Class Performance

  • Automatic stage & 4CH BSE as a basic option
  • Light weight & High productivity
  • Integrated EDS System (Option)
  • DIY installation

Advantages

  • Simple and Intuitive User Interface for Everyone
  • 65kg portable Tabletop SEM
  • 5-Axis Stage System
  • Maximum Sample Size – Horizontal : 140mm, Vertical : 80mm
  • X 10 ~ X 200,000 Magnification
  • Automatic Functions To Minimize Repetitive Tasks – Auto Focus, Auto Brightness & Contrast, Auto Gun Alignment, Auto Saturation
  • High Resolution Imaging – 5.0nm (SE Image) / 6.0nm (BSE Image)
  • Rapid analysis by exchanging specimen within 90 sec – Vacuum ready within 90 sec – Ventilation ready within 10 sec
  • 4CH BSED as a basic option(Combo, Topo)
  • Various kinds of specimens can be analyzable with optional detectors – EDS(All-in-one Model of SEM-EDS) *Oxford, Bruker, EDAX, Thermo compatible, Auto Rotation, Auto Tilt, Chamber Camera, Navigation

Discover our customer’s experience:
What our Customer is saying about their experience with CUBE II Tabletop SEM

Stage 5-axis Stage
-X : 42mm (Motorized)
-Y : 42mm (Motorized)
-Z : 5 ~ 53mm (Motorized)
-T : -90° ~ 90° (Manual)
-R : 360° (Beam Rotation)
Vacuum Mode High Vacuum Mode (<9×10-3 Pa)
Charge Reduction Mode
Vacuum System -Fully Automated Evacuation System
-Turbo molecular pump (Vacuum ready within 90 sec)
-Rotary vane pump
-Electrical valve system
Electron Gun Pre-centered Tungsten Filament
Detector SE Detector 4CH BSE Detector
Resolution 5.0nm (SE Image at 30kV)
Magnification x10 ~ x200,000
Acceleration Voltage 1kV ~ 30kV
Image Shift 100μm
Maximum Sample Size Horizontal : 140mm; Vertical : 80mm
Working Distance 5 ~ 53mm
Sample loading Time 90 sec (Vacuum) 10 sec (Vent)
Automatic Function Auto Brightness & Contrast, Auto Focus, Auto Gun Alignment, Auto Saturation, Auto Filament, Bias
Image Format JPG, TIFF, BMP, PNG
Display Mode Focus Mode : 320 x 240 pixel, Resizable
Preview Mode : 800 x 600
Slow Mode : Applicable to both preview and focus mode
Photo Mode : Up to 3200 x 2400
Dimension(mm) W x D x H = 410mm x 440mm x 520mm, 65kg
Operation Device(PC) Windows 10-based All-in-One 21.5” Workstation, 100% controlled by keyboard and mouse
Optional Devices EDS (All-in-one Model of SEM-EDS), Auto Rotation, Auto Tilt, Chamber Camera, Navigation
*Oxford, Bruker, EDAX, Thermo compatible
Power Supply Single Phase : 100 ~ 240VAC, 50 / 60Hz, 1kVA

 

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SEM is widely used across various fields to produce unprecedented images of the microscopic and nanometric world.
Our family of SEM models are widely-used in research fields and industry applications such as semiconductor,
flat-panel display, and nanotechnology labs .

  • Quality control of electronics circuits and semiconductor parts
  • Observation of microstructure of Secondary cell, CNT (Carbon Nano Tube), Solar Cell, Wafer, Bonding Wire, LED,
    Nano tech

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