Product Type:
Metrology & Handling
Application:
Scanning Electron Microscope
Product Description:
EMCrafts Genesis Series:
Scanning Electron Microscope with World-Class Performance
- Cube -Ⅱ (Tabletop SEM)
- Automatic stage & 4CH BSE as a basic option
- Light weight & High productivity
- Integrated EDS System (Option)
- DIY installation
1. Simple and Intuitive User Interface for Everyone
2. Weight 65kg portable Tabletop SEM
3. 5-Axis Stage System
– X, Y : 42mm(Motorized)
– Z : 5 ~ 53mm(Motorized)
– R : 360° (Beam rotation)
– T : -90 ~ 90° (Manual)
4. Maximum Sample Size
– Horizontal : 140mm, Vertical : 80mm
5. X 10 ~ X 200,000 Magnification
6. Automatic Functions To Minimize Repetitive
– Auto Focus, Auto Brightness & Contrast, Auto Gun Alignment,
Auto Saturation
7. High Resolution Imaging
– 5.0nm (SE Image) / 6.0nm (BSE Image)
8. Rapid analysis by exchanging specimen within 90 sec
– Vacuum ready within 90 sec
– Ventilation ready within 10 sec
9. 4CH BSED as a basic option(Combo, Topo)
10. Various kinds of specimens can be analyzable with optional detectors
– EDS(All-in-one Model of SEM-EDS) *Oxford, Bruker, EDAX, Thermo
compatible
Auto RotationAuto TiltChamber Camera
Navigation
| Model | CUBE-Ⅱ | ||
| Stage | 5-axis Stage – X : 42mm (Motorized) Y : 42mm (Motorized) – Z : 5 ~ 53mm (Motorized)– T : -90° ~ 90° (Manual) – R : 360° (Beam Rotation) |
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| Vacuum Mode | High Vacuum Mode (<9×10-3 Pa) Charge Reduction Mode |
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| Vacuum System | Fully Automated Evacuation System – Turbo molecular pump (Vacuum ready within 90 sec) – Rotary vane pump – Electrical valve system |
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| Electron Gun | Pre-centered Tungsten Filament | ||
| Detector | SE Detector4CH BSE Detector |
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| Resolution | 5.0nm (SE Image at 30kV) | ||
| Magnification | x10 ~ x200,000 | ||
| Acceleration Voltage | 1kV ~ 30kV | ||
| Image Shift | 100μm | ||
| Maximum Sample Size | Horizontal : 140mmVertical : 80mm |
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| Working Distance | 5 ~ 53mm | ||
| Sample loading Time | 90 sec (Vacuum)10 sec (Vent) |
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| Automatic Function | Auto Brightness & ContrastAuto FocusAuto Gun AlignmentAuto Saturation Auto Filament Bias |
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| Image Format | JPGTIFFBMPPNG |
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| Display Mode | Focus Mode : 320 x 240 pixel, Resizable Preview Mode : 800 x 600 Slow Mode : Applicable to both preview and focus mode Photo Mode : Up to 3200 x 2400 |
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| Dimension(mm) | W x D x H = 410mm x 440mm x 520mm65kg |
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| Operation Device(PC) | Windows 10-based All-in-One 21.5” Workstation100% controlled by keyboard and mouse |
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| Optional Devices | EDS (All-in-one Model of SEM-EDS)Auto RotationAuto TiltChamber CameraNavigation *Oxford, Bruker, EDAX, Thermo compatible |
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| Power Supply | Single Phase : 100 ~ 240VAC, 50 / 60Hz, 1kVA | ||
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SEM is widely used across various fields to produce unprecedented images of the microscopic and nanometric world.
Our family of SEM models are widely-used in research fields and industry applications such as semiconductor,
flat-panel display, and nanotechnology labs .
- Quality control of electronics circuits and semiconductor parts
- Observation of microstructure of Secondary cell, CNT (Carbon Nano Tube), Solar Cell, Wafer, Bonding Wire, LED,
Nano tech