Cube II (Tabletop SEM)

Product Enquiry

Product Enquiry Form

By EMCrafts

Supplier Info

Product Type:

Metrology & Handling


Application:

Scanning Electron Microscope


Product Description:

EMCrafts Genesis Series:

Scanning Electron Microscope with World-Class Performance

  • Cube -Ⅱ (Tabletop SEM)
  • Automatic stage & 4CH BSE as a basic option
  • Light weight & High productivity
  • Integrated EDS System (Option)
  • DIY installation

1. Simple and Intuitive User Interface for Everyone

2. Weight 65kg portable Tabletop SEM
3. 5-Axis Stage System
– X, Y : 42mm(Motorized)
– Z : 5 ~ 53mm(Motorized)
– R : 360° (Beam rotation)
– T : -90 ~ 90° (Manual)
4. Maximum Sample Size
– Horizontal : 140mm, Vertical : 80mm
5. X 10 ~ X 200,000 Magnification

6. Automatic Functions To Minimize Repetitive
– Auto Focus, Auto Brightness & Contrast, Auto Gun Alignment,
Auto Saturation
7. High Resolution Imaging
– 5.0nm (SE Image) / 6.0nm (BSE Image)
8. Rapid analysis by exchanging specimen within 90 sec
– Vacuum ready within 90 sec
– Ventilation ready within 10 sec
9. 4CH BSED as a basic option(Combo, Topo)
10. Various kinds of specimens can be analyzable with optional detectors
– EDS(All-in-one Model of SEM-EDS) *Oxford, Bruker, EDAX, Thermo compatible, Auto Rotation, Auto Tilt, Chamber Camera, Navigation


CUBE-Ⅱ specification
Model CUBE-Ⅱ
Stage 5-axis Stage
– X : 42mm (Motorized)Y : 42mm (Motorized) – Z : 5 ~ 53mm (Motorized)
– T : -90° ~ 90° (Manual) – R : 360° (Beam Rotation)
Vacuum Mode High Vacuum Mode (<9×10-3 Pa)
Charge Reduction Mode
Vacuum System Fully Automated Evacuation System
– Turbo molecular pump (Vacuum ready within 90 sec)
– Rotary vane pump
– Electrical valve system
Electron Gun Pre-centered Tungsten Filament
Detector SE Detector4CH BSE Detector
Resolution 5.0nm (SE Image at 30kV)
Magnification x10 ~ x200,000
Acceleration Voltage 1kV ~ 30kV
Image Shift 100μm
Maximum Sample Size Horizontal : 140mmVertical : 80mm
Working Distance 5 ~ 53mm
Sample loading Time 90 sec (Vacuum)10 sec (Vent)
Automatic Function Auto Brightness & ContrastAuto FocusAuto Gun AlignmentAuto Saturation
Auto FilamentBias
Image Format JPGTIFFBMPPNG
Display Mode Focus Mode : 320 x 240 pixel, Resizable
Preview Mode : 800 x 600
Slow Mode : Applicable to both preview and focus mode
Photo Mode : Up to 3200 x 2400
Dimension(mm) W x D x H = 410mm x 440mm x 520mm65kg
Operation Device(PC) Windows 10-based All-in-One 21.5” Workstation100% controlled by keyboard and mouse
Optional Devices EDS (All-in-one Model of SEM-EDS)Auto RotationAuto TiltChamber CameraNavigation
*Oxford, Bruker, EDAX, Thermo compatible
Power Supply Single Phase : 100 ~ 240VAC, 50 / 60Hz, 1kVA

There are currently no videos available.

SEM is widely used across various fields to produce unprecedented images of the microscopic and nanometric world.
Our family of SEM models are widely-used in research fields and industry applications such as semiconductor,
flat-panel display, and nanotechnology labs .

  • Quality control of electronics circuits and semiconductor parts
  • Observation of microstructure of Secondary cell, CNT (Carbon Nano Tube), Solar Cell, Wafer, Bonding Wire, LED,
    Nano tech


Product Enquiry Form