Parts & Consumables
PolyCHECK, black fabric Wiper fo inspection and verification
• Eliminates the need to contact SEM stubs and tape to critical chamber surfaces.
• Allows for faster analysis of particle sources during tool excursion events.
• Perfect for defect analysis involving SEM stubs.
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- Ideal for Go/No Go validation checks in vacuum maintainence procedures.
- Excellent general purpose cleanroom wiper for Semiconductor, Medical Device, FPD and Hard Disk Drive manufacturers.