CYPRESS – Die Attach Inspection System

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Supplier Info

Product Type:

Metrology & Handling


Optical Surface Inspection

Product Description:

▪ 2D inspection with good resolution
▪ 3D height measurement of the attached components
▪ Multiple handling of various types of packaging
– JEDEC tray, SUS tray, strip, etc.
▪ IR optics for inspection through silicon
* Optional stage heating

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